SPIE Proceedings [SPIE Symposium on Integrated Optoelectronic Devices - San Jose, CA (Friday 18 January 2002)] Test and Measurement Applications of Optoelectronic Devices - Nondestructive technique for the direct measurement of the local temperature distribution in VCSELs

✍ Scribed by Dabbicco, Maurizio; Spagnolo, Vincenzo; Ferrara, Michele; Scamarcio, Gaetano; Chin, Aland K.; Dutta, Niloy K.; Herrick, Robert W.; Linden, Kurt J.; McGraw, Daniel J.

• Book ID: 111880000
• Publisher: SPIE
• Year: 2002
• Weight: 156 KB
• Volume: 4648
• Category: Article
• DOI: 10.1117/12.462656