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SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - San Diego, CA (Sunday 19 July 1998)] Infrared Technology and Applications XXIV - Test, verification, and validation issues in modeling a generic electro-optic system

✍ Scribed by Smith, Moira I.; Hickman, Duncan; Murray-Smith, David J.; Andresen, Bjorn F.; Strojnik, Marija

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