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SPIE Proceedings [SPIE SPIE's First International Symposium on Fluctuations and Noise - Santa Fe, NM (Sunday 1 June 2003)] Noise in Devices and Circuits - Impact of scaling down on 1/f noise in MOSFETs

โœ Scribed by Valenza, Matteo; Hoffmann, Alain; Laigle, Arnaud; Rigaud, Dominique; Marin, Mathieu; Deen, M. Jamal; Celik-Butler, Zeynep; Levinshtein, Michael E.


Book ID
121692978
Publisher
SPIE
Year
2003
Weight
211 KB
Volume
5113
Category
Article

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