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SPIE Proceedings [SPIE SPIE's First International Symposium on Fluctuations and Noise - Santa Fe, NM (Sunday 1 June 2003)] Noise in Devices and Circuits - Generation-recombination noise in GaN and GaN-based devices

โœ Scribed by Pala, Nezih; Rumyantsev, Sergey L.; Shur, Michael S.; Levinshtein, Michael E.; Khan, M. Asif; Simin, Grigory S.; Gaska, Remis; Deen, M. Jamal; Celik-Butler, Zeynep; Levinshtein, Michael E.


Book ID
120475582
Publisher
SPIE
Year
2003
Weight
269 KB
Volume
5113
Category
Article

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