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SPIE Proceedings [SPIE SPIE Third International Symposium on Fluctuations and Noise - Austin, TX (Monday 23 May 2005)] Noise and Information in Nanoelectronics, Sensors, and Standards III - Noise in carbon nanotube electronics (Invited Paper)

✍ Scribed by Kingrey, Derek; Collins, Philip G.; Bergou, Janos A.; Smulko, Janusz M.; Dykman, Mark I.; Wang, Lijun

Book ID: 120582539
Publisher: SPIE
Year: 2005
Weight: 352 KB
Volume: 5846
Category: Article
DOI: 10.1117/12.609278

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