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SPIE Proceedings [SPIE Second International Symposium on Fluctuations and Noise - Maspalomas, Gran Canaria Island, Spain (Tuesday 25 May 2004)] Noise and Information in Nanoelectronics, Sensors, and Standards II - Bulk mechanism of mobility fluctuation depending on features of the semiconductor-environment interface

โœ Scribed by Melkonyan, Slavik V.; Smulko, Janusz M.; Blanter, Yaroslav; Dykman, Mark I.; Kish, Laszlo B.

Book ID
121380298
Publisher
SPIE
Year
2004
Weight
198 KB
Volume
5472
Category
Article

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