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SPIE Proceedings [SPIE SPIE Security + Defence - Dresden, Germany (Monday 23 September 2013)] Electro-Optical and Infrared Systems: Technology and Applications X - Test stand for non-uniformity correction of microbolometer focal plane arrays used in thermal cameras

✍ Scribed by Krupiński, Michał; Bareła, Jaroslaw; Firmanty, Krzysztof; Kastek, Mariusz; Huckridge, David A.; Ebert, Reinhard

Book ID: 121380967
Publisher: SPIE
Year: 2013
Weight: 433 KB
Volume: 8896
Category: Article
DOI: 10.1117/12.2028633

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