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SPIE Proceedings [SPIE SPIE Security + Defence - Dresden, Germany (Monday 23 September 2013)] Electro-Optical and Infrared Systems: Technology and Applications X - Test stand for non-uniformity correction of microbolometer focal plane arrays used in thermal cameras

✍ Scribed by Krupiński, Michał; Bareła, Jaroslaw; Firmanty, Krzysztof; Kastek, Mariusz; Huckridge, David A.; Ebert, Reinhard


Book ID
121380967
Publisher
SPIE
Year
2013
Weight
433 KB
Volume
8896
Category
Article

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