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SPIE Proceedings [SPIE SPIE Security + Defence - Dresden, Germany (Monday 23 September 2013)] Electro-Optical and Infrared Systems: Technology and Applications X - Image quality testing of assembled IR camera modules

✍ Scribed by Winters, Daniel; Erichsen, Patrik; Huckridge, David A.; Ebert, Reinhard

No coin nor oath required. For personal study only.

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