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SPIE Proceedings [SPIE SPIE Security + Defence - Dresden, Germany (Monday 23 September 2013)] Electro-Optical and Infrared Systems: Technology and Applications X - InGaAs infrared detector development for SWIR imaging applications

✍ Scribed by Rutz, F.; Kleinow, P.; Aidam, R.; Bronner, W.; Kirste, L.; Walther, M.; Huckridge, David A.; Ebert, Reinhard

No coin nor oath required. For personal study only.

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