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SPIE Proceedings [SPIE SPIE Proceedings - (Sunday 12 February 2012)] - Calculation of secondary charge carrier current in submicron channel MOSFETs at stress regimes of operation

✍ Scribed by Borzdov, Vladimir; Komarov, Fadei; Zhevnyak, Oleg; Galenchik, Vadim; Pozdnyakov, Dmitry; Borzdov, Andrei; Valiev, Kamil A.; Orlikovsky, Alexander A.

Book ID: 118248805
Publisher: SPIE
Year: 2006
Weight: 554 KB
Volume: 0
Category: Article
DOI: 10.1117/12.683488

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