SPIE Proceedings [SPIE SPIE Proceedings - (Sunday 12 February 2012)] - Monte Carlo study of influence of channel length and depth on electron transport in SOI MOSFETs

✍ Scribed by Zhevnyak, Oleg; Borzdov, Vladimir; Borzdov, Andrey; Pozdnyakov, Dmitry; Komarov, Fadei; Valiev, Kamil A.; Orlikovsky, Alexander A.

• Book ID: 118248807
• Publisher: SPIE
• Year: 2008
• Weight: 158 KB
• Volume: 0
• Category: Article
• DOI: 10.1117/12.802533