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SPIE Proceedings [SPIE SPIE Optics + Optoelectronics - Prague, Czech Republic (Monday 15 April 2013)] Damage to VUV, EUV, and X-ray Optics IV; and EUV and X-ray Optics: Synergy between Laboratory and Space III - 4H-SiC and novel SI GaAs-based M-S-M radiation hard photodetectors applicable in UV, EUV, and soft x-ray detection: design, technology, and performance testing

✍ Scribed by Dubecký, František; Kováč, Jaroslav; Kováč, Jaroslav; Zaťko, Bohumír; Oswald, Jirí; Hubík, Pavel; Kindl, Dobroslav; Vanko, Gabriel; Gombia, Enos; Ferrari, Claudio; Boháček, Pavol; Šagátová, Andrea; Nečas, Vladimír; Sekáčová, Mária; Juha, Libor; Bajt, Saša; London, Richard; Hudec, René; Pina, Ladislav

Book ID: 121433321
Publisher: SPIE
Year: 2013
Weight: 320 KB
Volume: 8777
Category: Article
DOI: 10.1117/12.2021729

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