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SPIE Proceedings [SPIE SPIE Optics + Optoelectronics - Prague, Czech Republic (Monday 15 April 2013)] Damage to VUV, EUV, and X-ray Optics IV; and EUV and X-ray Optics: Synergy between Laboratory and Space III - VUV-UV multiwavelength excitation process for high-quality ablation of fused silica

✍ Scribed by Sugioka, Koji; Midorikawa, Katsumi; Juha, Libor; Bajt, Saša; London, Richard; Hudec, René; Pina, Ladislav

Book ID: 120334713
Publisher: SPIE
Year: 2013
Weight: 889 KB
Volume: 8777
Category: Article
DOI: 10.1117/12.2019720

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