SPIE Proceedings [SPIE SPIE Optics + Optoelectronics - Prague, Czech Republic (Monday 15 April 2013)] Damage to VUV, EUV, and X-ray Optics IV; and EUV and X-ray Optics: Synergy between Laboratory and Space III - Characterizing the focus of a multilayer coated off-axis parabola for FLASH beam at λ = 4.3 nm

✍ Scribed by Leontowich, Adam F. G.; Aquila, Andrew; Stellato, Francesco; Bean, Richard; Fleckenstein, Holger; Prasciolu, Mauro; Liang, Mengning; DePonte, Daniel P.; Barty, Anton; Wang, Fenglin; Andreasson, Jakob; Hajdu, Janos; Chapman, Henry N.; Bajt, Saša; Juha, Libor; Bajt, Saša; London, Richard; Hudec, René; Pina, Ladislav

• Book ID: 120375495
• Publisher: SPIE
• Year: 2013
• Weight: 831 KB
• Volume: 8777
• Category: Article
• DOI: 10.1117/12.2022403