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SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Monday 23 May 2011)] O3A: Optics for Arts, Architecture, and Archaeology III - Optical techniques for the characetrization of surface-subsurface defects in painted layers

✍ Scribed by Daffara, Cl.; Fontana, R.; Melchiorre Di Crescenzo, M.; Scrascia, S.; Zendri, E.; Pezzati, Luca; Salimbeni, Renzo

Book ID: 118051353
Publisher: SPIE
Year: 2011
Weight: 632 KB
Volume: 8084
Category: Article
DOI: 10.1117/12.889959

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