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SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Monday 23 May 2011)] O3A: Optics for Arts, Architecture, and Archaeology III - Optical techniques for the characetrization of surface-subsurface defects in painted layers

✍ Scribed by Daffara, Cl.; Fontana, R.; Melchiorre Di Crescenzo, M.; Scrascia, S.; Zendri, E.; Pezzati, Luca; Salimbeni, Renzo


Book ID
118051353
Publisher
SPIE
Year
2011
Weight
632 KB
Volume
8084
Category
Article

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