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SPIE Proceedings [SPIE SPIE Optical Metrology 2013 - Munich, Germany (Monday 13 May 2013)] Videometrics, Range Imaging, and Applications XII; and Automated Visual Inspection - A study of systematic errors in the PMD CamBoard nano

✍ Scribed by Remondino, Fabio; Chow, Jacky C. K.; Lichti, Derek D.; Shortis, Mark R.; Beyerer, Jürgen; Puente León, Fernando


Book ID
120810008
Publisher
SPIE
Year
2013
Weight
401 KB
Volume
8791
Category
Article

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