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SPIE Proceedings [SPIE SPIE Optical Metrology 2013 - Munich, Germany (Monday 13 May 2013)] Videometrics, Range Imaging, and Applications XII; and Automated Visual Inspection - Evaluation of outlier detection based on support vector machine regression for close-range photogrammetry

✍ Scribed by Remondino, Fabio; Lu, Y. Y.; Stamatopoulos, C.; Shortis, Mark R.; Beyerer, Jürgen; Fraser, C. S.; Puente León, Fernando

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