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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 12 August 2012)] Infrared Remote Sensing and Instrumentation XX - Characterization of GaAs/AlGaAs resonant tunneling diodes with a GaInNAs absorption layer as 1.3 μm photo sensors

✍ Scribed by Hartmann, F.; Langer, F.; Bisping, D.; Musterer, A.; Höfling, S.; Kamp, M.; Forchel, A.; Worschech, L.; Strojnik, Marija; Paez, Gonzalo

Book ID: 121219028
Publisher: SPIE
Year: 2012
Weight: 522 KB
Volume: 8511
Category: Article
DOI: 10.1117/12.931118

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