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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 12 August 2012)] Infrared Remote Sensing and Instrumentation XX - Fourier transform spectrometer (FTS) servo characterization and improvement

✍ Scribed by Davidson, M.; Elwell, J.; Swasey, J.; Strojnik, Marija; Paez, Gonzalo

No coin nor oath required. For personal study only.

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