SPIE Proceedings [SPIE SPIE NanoScience + Engineering - San Diego, California, USA (Sunday 12 August 2012)] Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VI - Optical testing for meter size aspheric optics

✍ Scribed by Su, Peng; Oh, Chang Jin; Zhao, Chunyu; Burge, James H.; Postek, Michael T.; Coleman, Victoria A.; Orji, Ndubuisi G.

• Book ID: 118122407
• Publisher: SPIE
• Year: 2012
• Weight: 943 KB
• Volume: 8466
• Category: Article
• DOI: 10.1117/12.930513