SPIE Proceedings [SPIE SPIE NanoScience + Engineering - San Diego, California, United States (Sunday 25 August 2013)] Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VII - Pulse-to-pulse stability analysis in a frequency-doubled, q-switched Nd:YAG rod-laser

✍ Scribed by Tunes, Matheus A.; Schön, Cláudio G.; Wetter, Niklaus Ursus; Postek, Michael T.; Orji, Ndubuisi George

• Book ID: 121357840
• Publisher: SPIE
• Year: 2013
• Weight: 306 KB
• Volume: 8819
• Category: Article
• DOI: 10.1117/12.2025847