SPIE Proceedings [SPIE SPIE LASE - San Francisco, California, USA (Saturday 2 February 2013)] Laser Applications in Microelectronic and Optoelectronic Manufacturing (LAMOM) XVIII - Measuring the complex refractive index of metals in the solid and liquid state and its influence on the laser machining

✍ Scribed by Schmid, Marc; Zehnder, Sarah; Schwaller, Patrick; Neuenschwander, Beat; Zürcher, Joseph; Hunziker, Urs; Xu, Xianfan; Hennig, Guido; Nakata, Yoshiki; Roth, Stephan W.

• Book ID: 120460969
• Publisher: SPIE
• Year: 2013
• Weight: 526 KB
• Volume: 8607
• Category: Article
• DOI: 10.1117/12.2003744