SPIE Proceedings [SPIE SPIE LASE - San Francisco, California, USA (Saturday 2 February 2013)] High-Power Diode Laser Technology and Applications XI - Reliability of high power/brightness diode lasers emitting from 790 to 980 nm

✍ Scribed by Bao, L.; Bai, J.; Price, K.; Devito, M.; Grimshaw, M.; Dong, W.; Guan, X.; Zhang, S.; Zhou, H.; Bruce, K.; Dawson, D.; Kanskar, M.; Martinsen, R.; Haden, J.; Zediker, Mark S.

• Book ID: 120371515
• Publisher: SPIE
• Year: 2013
• Weight: 819 KB
• Volume: 8605
• Category: Article
• DOI: 10.1117/12.2005443