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SPIE Proceedings [SPIE SPIE LASE - San Francisco, California, USA (Saturday 2 February 2013)] High-Power Diode Laser Technology and Applications XI - Speckle characteristics of laser diodes for SWIR and NIR active imaging

✍ Scribed by Goldberg, Lew; Leach, Jeff; Chinn, Stephen; King, Vernon; Zediker, Mark S.

No coin nor oath required. For personal study only.

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