SPIE Proceedings [SPIE SPIE Fourth International Symposium on Fluctuations and Noise - Florence, Italy (Sunday 20 May 2007)] Noise and Fluctuations in Circuits, Devices, and Materials - Main sources of electron mobility fluctuations in semiconductors

✍ Scribed by Melkonyan, Slavik V.; Gasparyan, Ferdinand V.; Asriyan, Haik V.; Macucci, Massimo; Vandamme, Lode K.; Ciofi, Carmine; Weissman, Michael B.

• Book ID: 121505913
• Publisher: SPIE
• Year: 2007
• Weight: 213 KB
• Volume: 6600
• Category: Article
• DOI: 10.1117/12.724567