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SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Baltimore, Maryland, USA (Monday 29 April 2013)] Infrared Technology and Applications XXXIX - Characteristic of nickel oxide microbolometer

✍ Scribed by Koo, Gyo-hun; Jung, Young-Chul; Hahm, Sung-Ho; Jung, Dong-Geon; Lee, Yong Soo; Andresen, Bjørn F.; Fulop, Gabor F.; Hanson, Charles M.; Norton, Paul R.; Robert, Patrick


Book ID
120991575
Publisher
SPIE
Year
2013
Weight
513 KB
Volume
8704
Category
Article

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