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SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Baltimore, Maryland, USA (Monday 29 April 2013)] Infrared Technology and Applications XXXIX - High-resistivity and high-TCR vanadium oxide thin films for infrared imaging prepared by bias target ion-beam deposition

✍ Scribed by Jin, Yao; Basantani, Hitesh A.; Ozcelik, Adem; Jackson, Tom N.; Horn, Mark W.; Andresen, Bjørn F.; Fulop, Gabor F.; Hanson, Charles M.; Norton, Paul R.; Robert, Patrick

Book ID: 120612604
Publisher: SPIE
Year: 2013
Weight: 412 KB
Volume: 8704
Category: Article
DOI: 10.1117/12.2016277

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