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SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Baltimore, Maryland, USA (Monday 23 April 2012)] Scanning Microscopies 2012: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences - Past, present, and future of backscatter electron (BSE) imaging

✍ Scribed by Wells, Oliver C.; Gordon, Michael S.; Gignac, Lynne M.

Book ID: 120398756
Publisher: SPIE
Year: 2012
Weight: 194 KB
Volume: 8378
Category: Article
DOI: 10.1117/12.920001

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