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SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Baltimore, Maryland, USA (Monday 23 April 2012)] Scanning Microscopies 2012: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences - Extension of gravity center method for diameter calibration of polystyrene standard particles with a metrological AFM

✍ Scribed by Misumi, Ichiko; Takahata, Keiji; Sugawara, Kentaro; Gonda, Satoshi; Ehara, Kensei

Book ID: 120398754
Publisher: SPIE
Year: 2012
Weight: 807 KB
Volume: 8378
Category: Article
DOI: 10.1117/12.918528

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