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SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Baltimore, Maryland (Monday 23 April 2012)] Polarization: Measurement, Analysis, and Remote Sensing X - Real-time sub-pixel registration of imagery for an IR polarimeter

✍ Scribed by Hanks, Jonathan B.; Pezzaniti, J. Larry; Chenault, David B.; Romano, João M.

Book ID
120336787
Publisher
SPIE
Year
2012
Weight
984 KB
Volume
8364
Category
Article

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