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SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Baltimore, Maryland (Monday 23 April 2012)] Polarization: Measurement, Analysis, and Remote Sensing X - Optical tests of 200mm MWIR polarizer wafers: methodology and results

✍ Scribed by Erbach, Peter S.; Pezzaniti, J. Larry; Reinhardt, John C.; Chenault, David B.; Goldstein, Dennis H.

Book ID: 120334006
Publisher: SPIE
Year: 2012
Weight: 763 KB
Volume: 8364
Category: Article
DOI: 10.1117/12.920155

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