SPIE Proceedings [SPIE Soft X-Rays Optics and Technology - Berlin, Germany (Tuesday 8 December 1987)] Soft X-Ray Optics and Technology - X-Ray Measurements For The Determination Of Extension And Divergence Of Electron Beams In Storage Rings

✍ Scribed by Riehle, F.; Tegeler, E.; Wende, B.; Koch, E.; Schmahl, Guenther A.

• Book ID: 121477602
• Publisher: SPIE
• Year: 1986
• Weight: 244 KB
• Volume: 733
• Category: Article
• DOI: 10.1117/12.964895