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SPIE Proceedings [SPIE Optical Science and Technology, the SPIE 49th Annual Meeting - Denver, CO (Monday 2 August 2004)] Optical Constants of Materials for UV to X-Ray Wavelengths - Optical properties and application of uranium-based thin films for the extreme ultraviolet and soft x-ray region

✍ Scribed by Sandberg, Richard L.; Allred, David D.; Lunt, Shannon; Urry, Marie K.; Turley, R. Steven; Soufli, Regina; Seely, John F.

Book ID: 121372384
Publisher: SPIE
Year: 2004
Weight: 296 KB
Volume: 5538
Category: Article
DOI: 10.1117/12.560717

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