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SPIE Proceedings [SPIE Optical Science and Technology, the SPIE 49th Annual Meeting - Denver, CO (Monday 2 August 2004)] Developments in X-Ray Tomography IV - Hard x-ray phase imaging and tomography with a grating interferometer

✍ Scribed by Weitkamp, Timm; Diaz, Ana; Nohammer, Bernd; Pfeiffer, Franz; Rohbeck, Torben; Cloetens, Peter; Stampanoni, Marco; David, Christian; Bonse, Ulrich

Book ID: 118006121
Publisher: SPIE
Year: 2004
Weight: 726 KB
Volume: 5535
Category: Article
DOI: 10.1117/12.569643

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