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SPIE Proceedings [SPIE Optical Science and Technology, the SPIE 49th Annual Meeting - Denver, CO (Monday 2 August 2004)] Developments in X-Ray Tomography IV - On the relationship between intensity diffraction tomography and phase-contrast tomography

✍ Scribed by Anastasio, Mark A.; Shi, Daxin; Bonse, Ulrich

No coin nor oath required. For personal study only.

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