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SPIE Proceedings [SPIE Sixth International Symposium on Precision Mechanical Measurements - Guiyang, China (Thursday 8 August 2013)] Sixth International Symposium on Precision Mechanical Measurements - LED uniform illumination system for DMD-based confocal microscopy

✍ Scribed by Xiao, Kaimin; Hou, Wenmei; Xu, Qixin; Peng, Bofang; Ye, Shenghua; Fei, Yetai

Book ID: 121445429
Publisher: SPIE
Year: 2013
Weight: 557 KB
Volume: 8916
Category: Article
DOI: 10.1117/12.2035730

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