๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

SPIE Proceedings [SPIE Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life - Novosibirsk, Russia (Monday 9 September 2002)] Seventh International Symposium on Laser Metrology Applied to Science,Industry, and Everyday Life - Applications of x-ray interferometry in metrology and phase-contrast imaging

โœ Scribed by Mana, Giovanni; Chugui, Yuri V.; Bagayev, Sergei N.; Weckenmann, Albert; Osanna, P. Herbert


Book ID
118261240
Publisher
SPIE
Year
2002
Weight
725 KB
Volume
4900
Category
Article

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