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SPIE Proceedings [SPIE Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life - Novosibirsk, Russia (Monday 9 September 2002)] Seventh International Symposium on Laser Metrology Applied to Science,Industry, and Everyday Life - Applications of x-ray interferometry in metrology and phase-contrast imaging

✍ Scribed by Mana, Giovanni; Chugui, Yuri V.; Bagayev, Sergei N.; Weckenmann, Albert; Osanna, P. Herbert

No coin nor oath required. For personal study only.

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