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SPIE Proceedings [SPIE Photonics Europe - Strasbourg, France (Monday 26 April 2004)] Optical Micro- and Nanometrology in Manufacturing Technology - Femtosecond ablation scaling for different materials

โœ Scribed by Gonzales, Peggy; Bernath, Robert; Duncan, Joshua; Olmstead, Ty; Richardson, Martin; Gorecki, Christophe; Asundi, Anand K.


Book ID
121360663
Publisher
SPIE
Year
2004
Weight
401 KB
Volume
5458
Category
Article

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