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SPIE Proceedings [SPIE Photonics Asia 2007 - Beijing, China (Sunday 11 November 2007)] MEMS/MOEMS Technologies and Applications III - Investigation of charge accumulation in the dielectric for robust RF MEMS switches

โœ Scribed by Chen, Xuyuan; Hanke, Ulrik; San, Haisheng; Li, Gang; Zhan, Linxian; Chiao, Jung-Chih; Chen, Xuyuan; Zhou, Zhaoying; Li, Xinxin


Book ID
120173419
Publisher
SPIE
Year
2007
Weight
569 KB
Volume
6836
Category
Article

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