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SPIE Proceedings [SPIE Optics & Photonics - San Diego, CA (Sunday 13 August 2006)] Developments in X-Ray Tomography V - Tomography with grating interferometers at low-brilliance sources

✍ Scribed by Weitkamp, Timm; David, Christian; Kottler, Christian; Bunk, Oliver; Pfeiffer, Franz; Bonse, Ulrich

No coin nor oath required. For personal study only.

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