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SPIE Proceedings [SPIE Optics & Photonics - San Diego, CA (Sunday 13 August 2006)] Developments in X-Ray Tomography V - A comparison of a generalized DEI method with multiple-image radiography

✍ Scribed by Chou, Cheng-Ying; Anastasio, Mark A.; Brankov, Jovan G.; Wernick, Miles N.; Bonse, Ulrich

No coin nor oath required. For personal study only.

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