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SPIE Proceedings [SPIE Optics & Photonics 2005 - San Diego, CA (Sunday 31 July 2005)] Optical Manufacturing and Testing VI - Reflection grating photogrammetry: a technique for absolute shape measurement of specular free-form surfaces

✍ Scribed by Petz, Marcus; Tutsch, Rainer; Stahl, H. Philip

No coin nor oath required. For personal study only.

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