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SPIE Proceedings [SPIE Optics & Photonics 2005 - San Diego, CA (Sunday 31 July 2005)] Optical Manufacturing and Testing VI - Reverse optimization of a Shack-Hartmann wavefront sensor

✍ Scribed by Smith, Daniel G.; Greivenkamp, John E.; Stahl, H. Philip

No coin nor oath required. For personal study only.

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