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SPIE Proceedings [SPIE Optics and Optoelectronic Inspection and Control: Techniques, Applications, and Instruments - Beijing, China (Wednesday 8 November 2000)] Process Control and Inspection for Industry - Quick and dynamic measurements of geometric errors of CNC machines

✍ Scribed by Feng, Qibo; Hocken, Robert J.; Miller, Jimmie A.; Zhang, Shulian; Gao, Wei

Book ID: 121336008
Publisher: SPIE
Year: 2000
Weight: 255 KB
Volume: 4222
Category: Article
DOI: 10.1117/12.403838

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