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SPIE Proceedings [SPIE Optics and Optoelectronic Inspection and Control: Techniques, Applications, and Instruments - Beijing, China (Wednesday 8 November 2000)] Optical Measurement and Nondestructive Testing: Techniques and Applications - Surface characterization by surface plasmon resonance technique

✍ Scribed by Panigrahi, Simanchalo; Das, Nikunja B.; Hassan, Aseel K.; Ray, Asim K.; Song, FeiJun; Chen, Frank; Hung, Michael Y.Y.; Shang, H.M.

Book ID: 120647487
Publisher: SPIE
Year: 2000
Weight: 98 KB
Volume: 4221
Category: Article
DOI: 10.1117/12.402590

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