✦ LIBER ✦

SPIE Proceedings [SPIE Optical Science, Engineering and Instrumentation '97 - San Diego, CA (Sunday 27 July 1997)] Polarization: Measurement, Analysis, and Remote Sensing - Scattering from coated random rough surfaces characterized by the Mueller matrix

✍ Scribed by Zhang, Yuzhi; Bahar, Ezekiel; Goldstein, Dennis H.; Chipman, Russell A.

No coin nor oath required. For personal study only.

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