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SPIE Proceedings [SPIE Optical Science, Engineering and Instrumentation '97 - San Diego, CA (Sunday 27 July 1997)] Optical Manufacturing and Testing II - Transfer function characterization of laser Fizeau interferometer for high-spatial-frequency phase measurements

✍ Scribed by Novak, Erik; Ai, Chiayu; Wyant, James C.; Stahl, H. Philip

No coin nor oath required. For personal study only.

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