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SPIE Proceedings [SPIE Optical Engineering for Sensing and Nanotechnology (ICOSN '01) - Yokohama, Japan (Wednesday 6 June 2001)] Optical Engineering for Sensing and Nanotechnology (ICOSN 2001) - Low-coherence tandem interferometer for in-situ measurement of the refractive index

✍ Scribed by Hirai, Akiko; Matsumoto, Hirokazu; Iwata, Koichi

Book ID: 118069959
Publisher: SPIE
Year: 2001
Weight: 137 KB
Volume: 4416
Category: Article
DOI: 10.1117/12.427034

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