SPIE Proceedings [SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 10 August 2008)] Interferometry XIV: Techniques and Analysis - Denoising of digital speckle pattern interferometry fringes by means of Bidimensional Empirical Mode Decomposition

✍ Scribed by Bernini, María Belén; Schmit, Joanna; Creath, Katherine; Federico, Alejandro; Kaufmann, Guillermo H.; Towers, Catherine E.

• Book ID: 120275384
• Publisher: SPIE
• Year: 2008
• Weight: 235 KB
• Volume: 7063
• Category: Article
• DOI: 10.1117/12.786372