✦ LIBER ✦

SPIE Proceedings [SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 10 August 2008)] Developments in X-Ray Tomography VI - Compensation of mechanical inaccuracies in micro-CT and nano-CT

✍ Scribed by Sasov, Alexander; Stock, Stuart R.; Liu, Xuan; Salmon, Phil L.

No coin nor oath required. For personal study only.

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